VLSI Design

VLSI Design / 1998 / Article

Open Access

Volume 7 |Article ID 64716 | 12 pages | https://doi.org/10.1155/1998/64716

CLOTH MEASURE: A Software Tool for Estimating the Memory Requirements of Corner Stitching Data Structures

Received15 Apr 1995
Accepted20 Oct 1995

Abstract

In a previous paper [1], we derived formulae for estimating the storage requirements of the Rectangular and L-shaped Corner Stitching data structures [2, 3] for a given layout. These formulae require the computation of quantities called violations, which are geometric properties of the layout. In this paper, we present optimal Θ(n log n) algorithms for computing violations, where n is the number of rectangles in the layout. These algorithms are incorporated into a software tool called CLOTH MEASURE. Experiments conducted with CLOTH MEASURE show that it is a viable tool for estimating the memory requirements of a layout without having to implement the corner stitching data structures, which is a tedious and time-consuming task.

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


More related articles

0 Views | 0 Downloads | 0 Citations
 PDF  Download Citation  Citation
 Order printed copiesOrder

Related articles

We are committed to sharing findings related to COVID-19 as quickly and safely as possible. Any author submitting a COVID-19 paper should notify us at help@hindawi.com to ensure their research is fast-tracked and made available on a preprint server as soon as possible. We will be providing unlimited waivers of publication charges for accepted articles related to COVID-19. Sign up here as a reviewer to help fast-track new submissions.