VLSI Design On Self-Checking SystemsView this Special Issue
Jien-Chung Lo, "A Case Study of Self-Checking Circuits Reliability", VLSI Design, vol. 5, Article ID 071348, 11 pages, 1998. https://doi.org/10.1155/1998/71348
A Case Study of Self-Checking Circuits Reliability
In this paper, we analyze the reliability of self-checking circuits. A case study is presented in which a fault-tolerant system with duplicated self-checking modules is compared to the TMR version. It is shown that a duplicated self-checking system has a much higher reliability than that of the TMR counterpart. More importantly, the reliability of the self-checking system does not drop as sharply as that of the TMR version. We also demonstrate the trade-offs between hardware complexity and error handling capability of self-checking circuits. Alternative self-checking designs where some hardware redundancies are removed with the lost of fault-secure and/or self-testing properties are also studied.
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