VLSI Design

VLSI Design / 1998 / Article
Special Issue

VLSI Design On Self-Checking Systems

View this Special Issue

Open Access

Volume 5 |Article ID 071348 | https://doi.org/10.1155/1998/71348

Jien-Chung Lo, "A Case Study of Self-Checking Circuits Reliability", VLSI Design, vol. 5, Article ID 071348, 11 pages, 1998. https://doi.org/10.1155/1998/71348

A Case Study of Self-Checking Circuits Reliability

Abstract

In this paper, we analyze the reliability of self-checking circuits. A case study is presented in which a fault-tolerant system with duplicated self-checking modules is compared to the TMR version. It is shown that a duplicated self-checking system has a much higher reliability than that of the TMR counterpart. More importantly, the reliability of the self-checking system does not drop as sharply as that of the TMR version. We also demonstrate the trade-offs between hardware complexity and error handling capability of self-checking circuits. Alternative self-checking designs where some hardware redundancies are removed with the lost of fault-secure and/or self-testing properties are also studied.

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


More related articles

 PDF Download Citation Citation
 Order printed copiesOrder
Views172
Downloads353
Citations

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.