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VLSI Design
Volume 5 (1998), Issue 4, Pages 373-383

A Case Study of Self-Checking Circuits Reliability

Department of Electrical and Computer Engineering, The University of Rhode lsland, Kingston, RI 02881-0805, USA

Copyright © 1998 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jien-Chung Lo, “A Case Study of Self-Checking Circuits Reliability,” VLSI Design, vol. 5, no. 4, pp. 373-383, 1998. doi:10.1155/1998/71348