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VLSI Design
Volume 10, Issue 2, Pages 143-153
http://dx.doi.org/10.1155/1999/54564

Automatic Test Timing Assignment for RAMs Using Linear Programming

1Department of Computer Science, National Tsing-Hua University, Taiwan 300, Hsin-Chu, China
2Vate Technology Co., Ltd., 9 Li-Hsin Rd. V, Science-Based Industrial Park, Taiwan 300, Hsin-Chu, China

Received 23 June 1997; Accepted 24 July 1998

Copyright © 1999 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Wen-Jer Wu and Chuan Yi Tang, “Automatic Test Timing Assignment for RAMs Using Linear Programming,” VLSI Design, vol. 10, no. 2, pp. 143-153, 1999. https://doi.org/10.1155/1999/54564.