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VLSI Design
Volume 10, Issue 2, Pages 127-141
http://dx.doi.org/10.1155/1999/97179

Signature Analysis for Test Responses of Sequential Circuits

Institute of Computer Design and Fault Tolerance, University of Karlsruhe, Karlsruhe D-76128, Germany

Received 10 November 1997; Accepted 6 November 1998

Copyright © 1999 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Albrecht P. Stroele, “Signature Analysis for Test Responses of Sequential Circuits,” VLSI Design, vol. 10, no. 2, pp. 127-141, 1999. https://doi.org/10.1155/1999/97179.