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VLSI Design
Volume 15, Issue 2, Pages 491-498
http://dx.doi.org/10.1080/1065514021000012101

Improving Datapath Testability by Modifying Controller Specification

Laboratoire d'Informatique, de Robotique et de Micro-électronique de Montpellier, U.M.R. 5506 CNRS/Université de Montpellier 2, 161 rue Ada, Montpellier Cedex 5 34392, France

Received 15 November 2000; Revised 28 March 2001

Copyright © 2002 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Srivaths Ravi, and Michael Joseph, “High-Level Test Synthesis: A Survey from Synthesis Process Flow Perspective,” Acm Transactions on Design Automation of Electronic Systems, vol. 19, no. 4, 2014. View at Publisher · View at Google Scholar