Table of Contents
VLSI Design
Volume 2007, Article ID 67019, 6 pages
Research Article

Low-Power Built-In Self-Test Techniques for Embedded SRAMs

Department of Electronic Engineering, Fu Jen Catholic University, Taipei County 24205, Taiwan

Received 30 January 2007; Accepted 5 September 2007

Academic Editor: Bernard Courtois

Copyright © 2007 Shyue-Kung Lu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [2 citations]

The following is the list of published articles that have cited the current article.

  • Won-Jae Shin, Jee-Hyun Kim, Kwang-Soo Jeong, Jae-Hoon Yi, Hyoung-Kyu Song, and Young-Hwan You, “An Improved Scattered Pilot Detection Scheme for OFDM-Based DVB-H,” 2008 IEEE 10th International Symposium on Spread Spectrum Techniques and Applications, pp. 481–484, . View at Publisher · View at Google Scholar
  • Usha Mehta, Kankar Dasgupta, and Niranjan Devashrayee, “Suitability of Various Low-Power Testing Techniques for IP Core-Based SoC: A Survey,” VLSI Design, vol. 2011, pp. 1–7, 2011. View at Publisher · View at Google Scholar