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VLSI Design
Volume 2007 (2007), Article ID 67019, 6 pages
Research Article

Low-Power Built-In Self-Test Techniques for Embedded SRAMs

Department of Electronic Engineering, Fu Jen Catholic University, Taipei County 24205, Taiwan

Received 30 January 2007; Accepted 5 September 2007

Academic Editor: Bernard Courtois

Copyright © 2007 Shyue-Kung Lu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Shyue-Kung Lu, Yuang-Cheng Hsiao, Chia-Hsiu Liu, and Chun-Lin Yang, “Low-Power Built-In Self-Test Techniques for Embedded SRAMs,” VLSI Design, vol. 2007, Article ID 67019, 6 pages, 2007. doi:10.1155/2007/67019