VLSI Design

VLSI Design / 2008 / Article / Fig 12

Research Article

An Energy-Efficient Multiwire Error Control Scheme for Reliable On-Chip Interconnects Using Hamming Product Codes

Figure 12

Residual flit-error rate comparison of different error control schemes.
(a) Multiple independent errors
(b) The combination of multiple independent errors and burst errors

Article of the Year Award: Outstanding research contributions of 2020, as selected by our Chief Editors. Read the winning articles.