An Energy-Efficient Multiwire Error Control Scheme for Reliable On-Chip Interconnects Using Hamming Product Codes

<table class="table-group" width="800px"><tr class="fig-image" id="a"><td><img alt="109490.fig.012a" src="https://static.hindawi.com/articles/vlsi/volume-2008/109490/figures/109490.fig.012a.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(a) </b>Multiple independent errors</td></tr></table></td></tr><tr class="fig-image" id="b"><td><img alt="109490.fig.012b" src="https://static.hindawi.com/articles/vlsi/volume-2008/109490/figures/109490.fig.012b.jpg"/></td></tr><tr class="fig-caption"><td align="center"><table><tr><td><b>(b) </b>The combination of multiple independent
 errors and burst errors</td></tr></table></td></tr></table>

<table>Residual flit-error rate
 comparison of different error control schemes.</table>

VLSI Design

fig12

Figure 12

Figure 12: An Energy-Efficient Multiwire Error Control Scheme for Reliable On-Chip Interconnects Using Hamming Product Codes 