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VLSI Design
Volume 2008 (2008), Article ID 165709, 9 pages
http://dx.doi.org/10.1155/2008/165709
Research Article

Antirandom Testing: A Distance-Based Approach

1Electrical and Computer Engineering Department, Colorado State University, Fort Collins, CO 80523, USA
2Computer Science Department, Colorado State University, Fort Collins, CO 80523, USA

Received 19 March 2007; Accepted 16 January 2008

Academic Editor: Jacob Abraham

Copyright © 2008 Shen Hui Wu et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [9 citations]

The following is the list of published articles that have cited the current article.

  • Mohammad Alshraideh, Leonardo Bottaci, and Basel A. Mahafzah, “Using program data-state scarcity to guide automatic test data generation,” Software Quality Journal, vol. 18, no. 1, pp. 109–144, 2009. View at Publisher · View at Google Scholar
  • Yarmolik, and Yarmolik, “The synthesis of probability tests with a small number of kits,” Automatic Control and Computer Sciences, vol. 45, no. 3, pp. 133–141, 2011. View at Publisher · View at Google Scholar
  • V. N. Yarmolik, “Controlled random tests,” Automation and Remote Control, vol. 73, no. 10, pp. 1704–1714, 2012. View at Publisher · View at Google Scholar
  • Ireneusz Mrozek, and Vyacheslav N. Yarmolik, “Iterative Antirandom Testing,” Journal of Electronic Testing, vol. 28, no. 3, pp. 301–315, 2012. View at Publisher · View at Google Scholar
  • Ireneusz Mrozek, and Vyacheslav Yarmolik, “Antirandom Test Vectors for BIST in Hardware/Software Systems,” Fundamenta Informaticae, vol. 119, no. 2, pp. 163–185, 2012. View at Publisher · View at Google Scholar
  • Yarmolik, and Yarmolik, “Address sequences,” Automatic Control and Computer Sciences, vol. 48, no. 4, pp. 207–213, 2014. View at Publisher · View at Google Scholar
  • Mauro Baluda, Giovanni Denaro, and Mauro Pezze, “Bidirectional Symbolic Analysis for Effective Branch Testing,” IEEE Transactions on Software Engineering, vol. 42, no. 5, pp. 403–426, 2016. View at Publisher · View at Google Scholar
  • Ireneusz Mrozek, and Vyacheslav Yarmolik, “Multiple Controlled Random Testing,” Fundamenta Informaticae, vol. 144, no. 1, pp. 23–43, 2016. View at Publisher · View at Google Scholar
  • P. N. Bibilo, N. A. Avdeev, S. N. Kardash, N. A. Kirienko, Yu. Yu. Lankevich, I. P. Loginova, V. I. Romanov, D. I. Cheremisinov, and L. D. Cheremisinova, “A System for Logical Design of Custom CMOS VLSI Functional Blocks with Reduced Power Consumption,” Russian Microelectronics, vol. 47, no. 1, pp. 65–81, 2018. View at Publisher · View at Google Scholar