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VLSI Design
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Special Issues
VLSI Design
/
2008
/
Article
/
Alg 2
/
Research Article
A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences
Algorithm 2
Serial-search algorithm.
int serial-search
(
𝑁
,
𝐵
,
𝑉
)
{
int
𝑉
,
𝑁
,
𝐵
,
𝐿
;
f
o
r
(
𝐿
=
1
;
𝐿
<
=
𝑁
−
1
;
𝐿
+
+
)
i
f
(
𝐿
∗
𝐵
%
(
𝑁
−
1
)
=
=
𝑉
)
r
e
t
u
r
n
(
𝐿
)
;
}