A Low-Cost BIST Scheme for Test Vector Embedding in Accumulator-Generated Sequences

Table 3

Test set embedding into randomly generated test sets (average of three experiments).

𝑛	𝑇	𝑑min [11]	𝑑min proposed	Difference (%)	𝐸[𝑑]
10	10	644	729	13,20%	745
	20	765	829	8,37%	878
	50	921	930	0,98%	964
	100	944	985	4,34%	994
12	10	2 973	2 923	−1,68%	2 979
	20	3 254	3 484	7,07%	3 511
	50	3 453	3 725	7,88%	3 855
	100	3 823	3 867	1,15%	3 974
14	10	11 428	9 456	−17,26%	11 916
	20	12 225	13 003	6,36%	14 043
	50	14 261	14 439	1,25%	15 420
	100	15 497	15 612	0,74%	15 897
16	10	44 673	41 792	−6,45%	47 663
	20	47 474	51 521	8,52%	56 174
	50	58 957	60 488	2,60%	61 681
	100	61 908	63 985	3,35%	63 589
18	10	184 884	162 783	−11,95%	190 650
	20	202 934	204 156	0,60%	224 695
	50	230 368	238 016	3,32%	246 724
	100	243 760	251 555	3,20%	254 358
20	10	737 360	601 989	−18,36%	762 601
	20	770 265	804 160	4,40%	898 779
	50	915 790	982 506	7,29%	986 895
	100	972 600	1 017 134	4,58%	1 017 430
22	10	3 011 089	2 317 584	−23,03%	3 050 403
	20	3 340 134	2 649 779	−20,67%	3 595 118
	50	3 787 780	3 953 723	4,38%	3 947 580
	100	3 965 825	3 988 537	0,57%	4 069 721
24	10	10 435 133	9 920 759	−4,93%	12 201 612
	20	12 462 717	14 217 794	14,08%	14 380 471
	50	14 882 312	15 513 764	4,24%	15 790 321
	100	15 475 737	16 194 611	4,65%	16 278 883
	Average overhead = sum/32			0,39%