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VLSI Design
Volume 2015, Article ID 256474, 9 pages
http://dx.doi.org/10.1155/2015/256474
Research Article

Functional Testbench Qualification by Mutation Analysis

1Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China
2Institute of Very Large Scale Integrated Circuit Design, Zhejiang University, Hangzhou 310027, China
3Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing 100080, China

Received 2 February 2015; Revised 16 April 2015; Accepted 26 April 2015

Academic Editor: Avi Ziv

Copyright © 2015 Kai Huang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [4 citations]

The following is the list of published articles that have cited the current article.

  • Chaudhry Indra Kumar, Arvind Sharma, Sandeep Miryala, and Anand Bulusu, “A novel energy-efficient self-correcting methodology employing INWE,” 2016 13th International Conference on Synthesis, Modeling, Analysis and Simulation Methods and Applications to Circuit Design (SMACD), pp. 1–4, . View at Publisher · View at Google Scholar
  • Daniel Große, Hoang M. Le, Muhammad Hassan, and Rolf Drechsler, “Guided lightweight Software test qualification for IP integration using Virtual Prototypes,” Proceedings of the 34th IEEE International Conference on Computer Design, ICCD 2016, pp. 606–613, 2016. View at Publisher · View at Google Scholar
  • Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio, Pascal Benoit, and Lionel Torres, “Computing reliability: On the differences between software testing and software fault injection techniques,” Microprocessors and Microsystems, vol. 50, pp. 102–112, 2017. View at Publisher · View at Google Scholar
  • Prokash Ghosh, “Qualification of tied-off signals inSoC verification using mutation analysis,” Proceeding - IEEE International Conference on Computing, Communication and Automation, ICCCA 2016, pp. 1464–1469, 2017. View at Publisher · View at Google Scholar