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VLSI Design
Volume 2015 (2015), Article ID 256474, 9 pages
Research Article

Functional Testbench Qualification by Mutation Analysis

1Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China
2Institute of Very Large Scale Integrated Circuit Design, Zhejiang University, Hangzhou 310027, China
3Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing 100080, China

Received 2 February 2015; Revised 16 April 2015; Accepted 26 April 2015

Academic Editor: Avi Ziv

Copyright © 2015 Kai Huang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

Citations to this Article [1 citation]

The following is the list of published articles that have cited the current article.

  • Maha Kooli, Firas Kaddachi, Giorgio Di Natale, Alberto Bosio, Pascal Benoit, and Lionel Torres, “Computing reliability: On the differences between software testing and software fault injection techniques,” Microprocessors and Microsystems, vol. 50, pp. 102–112, 2017. View at Publisher ยท View at Google Scholar