Table of Contents
VLSI Design
Volume 2015, Article ID 256474, 9 pages
http://dx.doi.org/10.1155/2015/256474
Research Article

Functional Testbench Qualification by Mutation Analysis

1Department of Information Science and Electronic Engineering, Zhejiang University, Hangzhou 310027, China
2Institute of Very Large Scale Integrated Circuit Design, Zhejiang University, Hangzhou 310027, China
3Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing 100080, China

Received 2 February 2015; Revised 16 April 2015; Accepted 26 April 2015

Academic Editor: Avi Ziv

Copyright © 2015 Kai Huang et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Kai Huang, Peng Zhu, Rongjie Yan, and Xiaolang Yan, “Functional Testbench Qualification by Mutation Analysis,” VLSI Design, vol. 2015, Article ID 256474, 9 pages, 2015. https://doi.org/10.1155/2015/256474.