Table of Contents
VLSI Design
Volume 2016, Article ID 6475932, 8 pages
Research Article

A Low Complexity All-Digital Background Calibration Technique for Time-Interleaved ADCs

1Institute of VLSI Design, Hefei University of Technology, Hefei, China
2Department of Electronic Science & Technology, University of Science and Technology of China, 443 Huangshan Road, Hefei, Anhui, China

Received 27 May 2016; Revised 18 August 2016; Accepted 1 September 2016

Academic Editor: Chien-In Henry Chen

Copyright © 2016 Hongmei Chen et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

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