Table of Contents
X-Ray Optics and Instrumentation
Volume 2008, Article ID 168237, 7 pages
Research Article

Custom Hardware Processor to Compute a Figure of Merit for the Fit of X-Ray Diffraction Peaks

1Department of Technologies of Computers and Communications, Polytechnic Institute, University of Extremadura, Campus Universitario s/n, 10071 Caceres, Spain
2Department of Applied Physics, School of Industrial Engineering, University of Extremadura, Avenida de Elvas s/n, 06071 Badajoz, Spain
3Department of Computer Science, Polytechnic Institute of Leiria, Alto do Vieiro, 2401-951 Leiria, Portugal

Received 24 October 2007; Revised 5 February 2008; Accepted 24 March 2008

Academic Editor: Scott Misture

Copyright © 2008 Juan A. Gomez-Pulido et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


A custom processor based on reconfigurable hardware technology is proposed in order to compute the figure of merit used to measure the quality of the fit of X-ray diffraction peaks. As the experimental X-ray profiles can present many peaks severely overlapped, it is necessary to select the best model among a large set of reasonably good solutions. Determining the best solution is computationally intensive, because this is a hard combinatorial optimization problem. The proposed processors, working in parallel, increase the performance relative to a software implementation.