Table of Contents
X-Ray Optics and Instrumentation
Volume 2008, Article ID 408702, 9 pages
Research Article

Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction

Kazuo Inamori School of Engineering, Alfred University, Alfred, NY 14802, USA

Received 24 February 2008; Accepted 18 June 2008

Academic Editor: Walter Gibson

Copyright © 2008 Scott T. Misture. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


The performance of parallel beam multilayer optics, including a parabolic multilayer Osmic MaxFlux GO-13N and a flat custom multilayer, was evaluated experimentally and compared to Bragg-Brentano and traditional ‘‘parallel beam’’ or ‘‘thin film’’ optical geometries. A novel arrangement of a parabolic multilayer in the incident beam with a flat multilayer in the diffracted beam functioning as an analyzer crystal was proven effective for powder diffraction applications. The dual-optic configuration improves resolution while eliminating sample displacement and transparency errors as expected for a configuration with equatorial divergence below 100 arcseconds. Fundamental parameters fitting showed that the parabolic multilayer can be accurately modeled using a constant Gaussian function, while a long parallel-plate soller collimator requires a constant hat function. No additional convolutions are necessary for the diffracted-beam flat multilayer because of the lower acceptance angle.