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X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
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2008
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Article
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Fig 9
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Research Article
Application of Single and Dual Multilayer Optics for Powder X-Ray Diffraction
Figure 9
Rietveld plot for SRM640c Si on a square root scale. Inset shows high angle region on a linear scale.