X-Ray Optics and Instrumentation / 2010 / Article / Fig 28

Review Article

Kirkpatrick-Baez (KB) and Lobster Eye (LE) Optics for Astronomical and Laboratory Applications

Figure 28

Tapping AFM images of the surface of the double-sided X-ray reflecting flats taken in collaboration in the test facility of the Astronomical Observatory in Brera, Italy—the resulting micro roughness RMS is 0.3 nm.