Table of Contents
X-Ray Optics and Instrumentation
Volume 2010 (2010), Article ID 401854, 10 pages
http://dx.doi.org/10.1155/2010/401854
Review Article

Multilayer Laue Lens: A Path Toward One Nanometer X-Ray Focusing

1Center for Nanoscale Materials, Argonne National Laboratory, Argonne, IL 60439, USA
2National Synchrotron Light Source II, Brookhaven National Laboratory, Upton, NY 11973, USA
3Materials Science Division, Argonne National Laboratory, Argonne, IL 60439, USA
4Department of Advanced Materials Engineering and BK21 Education Center of Mould Technology for Advanced Materials and Parts, Chosun University, Gwangju 501–759, Republic of Korea
5Advanced Photon Source, Argonne National Laboratory, Argonne, IL 60439, USA

Received 12 May 2010; Accepted 13 September 2010

Academic Editor: Gene Ice

Copyright © 2010 Hanfei Yan et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Hanfei Yan, Hyon Chol Kang, Ray Conley, et al., “Multilayer Laue Lens: A Path Toward One Nanometer X-Ray Focusing,” X-Ray Optics and Instrumentation, vol. 2010, Article ID 401854, 10 pages, 2010. doi:10.1155/2010/401854