Table of Contents
X-Ray Optics and Instrumentation
Volume 2010 (2010), Article ID 583626, 10 pages
http://dx.doi.org/10.1155/2010/583626
Research Article

Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

1National Security Technologies, LLC (NSTec), 161 S. Vasco Road, Livermore, CA 94550, USA
2Lawrence Livermore National Laboratory (LLNL), 7000 East Avenue, Livermore, CA 94550, USA

Received 16 December 2009; Accepted 7 June 2010

Academic Editor: Gene Ice

Copyright © 2010 Michael J. Haugh and Richard Stewart. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Michael J. Haugh and Richard Stewart, “Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer,” X-Ray Optics and Instrumentation, vol. 2010, Article ID 583626, 10 pages, 2010. doi:10.1155/2010/583626