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X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
/
2010
/
Article
/
Fig 11
/
Research Article
Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer
Figure 11
Comparing the crystal shown in Figure
10
when it was 300
μ
m thick to the same crystal after it was cleaved to 5
μ
m thick.