Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

<table>Broadening due to curved crystal curvature with crystals of thickness varying from 5 microns to 100 microns at 1.6 m radius of curvature, calculated with Takagi-Taupin equation.</table>

X-Ray Optics and Instrumentation

fig5

Figure 5

Figure 5: Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer 