Journals
Publish with us
Publishing partnerships
About us
Blog
X-Ray Optics and Instrumentation
Table of Contents
Special Issues
X-Ray Optics and Instrumentation
/
2010
/
Article
/
Fig 8
/
Research Article
Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer
Figure 8
Reflectivity curve for Si-Si double crystal measurement at 9713 eV.