Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

Table 2

Calculated Mica 006 Crystal Properties at 11442.3 eV.

Polarization	$R_p$	FWHM,  mdeg	FWHM, $\mu$rad	Integrated Reflection Curve,  mdeg	Integrated Reflection Curve, $\mu$rad
mica 006
$\sigma$	0.932	0.728	12.708	0.868	15.142
$\pi$	0.928	0.690	12.037	0.820	14.308
mixed	0.930	0.704	12.37	0.844	14.716