Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

Table 3

Calculated and measured silicon 111 crystal properties at 11442.3 eV and 9713.3 eV.

	Peak reflectivity, $R_p$	FWHM,  mdeg	FWHM, $\mu$rad	Integrated reflection coefficient,  mdeg	Integrated reflection coefficient, $\mu$rad
11443.2 eV
Mixed polarization	0.966	1.280	22.344	1.571	27.42
Measured double crystal	0.41	4.1	71.6	2.13	37.2
Single crystal (calculated from the double crystal)		2.85	49.7
9713.3 eV
Mixed polarization	0.953	1.504	25.250	1.820	31.76
Measured double crystal	0.35	5.2	90.8	2.31	40.3
Single crystal (calculated from the double crystal)		3.61	63.0