(a) SEM image of the indented area with Cr lamellae in NiAl matrix chosen for DAXM measurements. The growth direction of both lamellae kinds is along direction. The direction of the beam trajectory intercepting the sample surface at is shown by an arrow. Depth-resolved DAXM measurements of the indented sample were performed for locations 1 and 2. (b) Load-displacement curve during the indentation. The main parameters of the load-displacement curve, maximum force and displacement during indentation, were further used in simulations. (c) Stereographic projection showing that growth is along crystallographic direction. The different fonts of the crystallographic indices on the figure refer to different symmetry of crystallographic directions. Larger indices correspond to higher symmetry directions. For example, the direction corresponds to growth direction that is almost in the center of the projection, and other directions from the same family, that is, , , and are of the same size. (d) Geometry of the X-ray microbeam intercepting different NiAl and Cr lamellae with depth.