The TDDB Characteristics of Ultra-Thin Gate Oxide MOS Capacitors under Constant Voltage Stress and Substrate Hot-Carrier Injection

<div>Energy-band diagram of the ultra-thin gate oxide NMOS capacitor.</div>

Advances in Condensed Matter Physics

Figure 6: The TDDB Characteristics of Ultra-Thin Gate Oxide MOS Capacitors under Constant Voltage Stress and Substrate Hot-Carrier Injection 