Research Article

Prospects of 4H-SiC Double Drift Region IMPATT Device as a Photo-Sensitive High-Power Source at 0.7 Terahertz Frequency Regime

Table 1

Design parameters of 4H-SiC impatt at thz frequency.

DDR diode type Doping conc. ( region) (1024 m−3) Doping conc. ( region) (1023 m−3) Width of the region (nm) Width of the region (nm) Current density (1010 A m−2)

4H-SiC3.03.080.080.01.37