Research Article

A High Rigidity and Precision Scanning Tunneling Microscope with Decoupled and Scans

Table 1

Material properties for finite element analysis.

Young’s modulus (1010 N/m2)Density (g/cm3)Poisson ratio

Piezoceramics6.37.450.31
Tantalum3616.690.34
Sapphire68.54.000.28