Ultrasonic Spray Pyrolysis Deposited Copper Sulphide Thin Films for Solar Cell Applications

Table 1

Comparison of observed XRD data of thin films with the JCPDS cards. The film thickness, lattice type, crystallite size calculated by Scherrer formula, and contact angle are also summarized.

Thin film	Film thickness (nm)	Observed values		Standard values		hkl	Phase	Lattice	Crystallite size	Contact angle
		(°)	d (Å)	(°)	d (Å)				D (nm)	(°)
TF1	160	27.74	3.22	27.68	3.22		CuS	Hexagonal	11.92	96.60
		29.48	3.03	29.28	3.05		CuS	Hexagonal
		31.76	2.80	31.79	2.81		CuS	Hexagonal
		48.24	1.89	47.94	1.90		CuS	Hexagonal
		59.64	1.55	59.35	1.56		CuS	Hexagonal
TF2	380	28.16	3.18	27.95	3.19		Cu1.765S	Cubic	10.80	107.83
		32.26	2.76	32.27	2.77		Cu1.765S	Cubic
		46.46	1.95	46.21	1.96		Cu1.765S	Cubic
		54.80	1.67	54.79	1.67		Cu1.765S	Cubic
TF3	172	27.92	3.18	27.95	3.19		Cu1.765S	Cubic	9.60	96.97
		32.44	2.76	32.27	2.77		Cu1.765S	Cubic
		46.62	1.95	46.28	1.96		Cu2S	Cubic
		54.78	1.67	54.79	1.67		Cu1.765S	Cubic