Characterization of the Resistance and Force of a Carbon Nanotube/Metal Side Contact by Nanomanipulation

Figure 6

Measurement of total resistances with increasing number of EBID deposits. (a), (c), and (e) show SEM images of the bridged CNT with 0, 1, and 7 EBID deposits at A2, respectively. (b), (d), and (f) show the corresponding curves recorded by a Keithley 6430 source measure unit. Scale bar indicates 1 μm.

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