Journals
Publish with us
Publishing partnerships
About us
Blog
Scanning
Journal overview
For authors
For reviewers
For editors
Table of Contents
Special Issues
Scanning
/
2020
/
Article
/
Fig 2
/
Review Article
Application of FIB-SEM Techniques for the Advanced Characterization of Earth and Planetary Materials
Figure 2
Principle of FIB (a) imaging, (b) milling, and (c) deposition (modified from [
21
]).
(a)
(b)
(c)