Research Article
Genetic Variability and Association of Yield and Yield-Related Traits under Moisture Stress in Common Bean Genotypes (Phaseolus vulgaris L.) at Melkassa and Miesso, Ethiopia
Table 3
Analysis of variance for various traits of the common bean genotypes at Melkassa and Miesso in the 2018 cropping season.
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Significant at 1% and 5% probability levels, respectively. PH = plant height, DF = days to 50% flowering, DM = days to 90% maturity, GFP = grain filling period, INL = internode length, NN = number of node, PP = pod per plant, SP = seed per plant, HSW = hundred seed weight, and SY = seed yield. |