Research Article

Genetic Variability and Association of Yield and Yield-Related Traits under Moisture Stress in Common Bean Genotypes (Phaseolus vulgaris L.) at Melkassa and Miesso, Ethiopia

Table 8

Estimate of direct (bold diagonal) and indirect effects (off diagonal) of yield-related traits on seed yield at phenotypic level in 25 common bean genotypes tested at Melkassa and Miesso in 2018 cropping season.

MelkassaMiesso
TraitsDFGFPINLPPTraitsDMGFPSPSW

DF0.20840.04923−0.00760.02748DM0.2445460.0410660.00887−0.03091
GFP−0.0729−0.1407−0.0263−0.0305GFP0.213860.0469580.015439−0.02863
INL−0.00650.015220.24313−0.0237SP0.0060130.002010.3607190.046457
PP0.02640.01978−0.02660.21665SW−0.0359−0.006380.0795890.210557
Residual value = 0.089Residual value = 0.085