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Advances in Condensed Matter Physics
Volume 2010 (2010), Article ID 518209, 6 pages
Research Article

Electrical Characteristics and Nanocrystalline Formation of Sprayed Iridium Oxide Thin Films

1Physics Department, Faculty of Science, Hail University, Hail, Saudi Arabia
2Physics Department, Faculty of Science, El-Minia University, El-Minia 11511, Egypt

Received 27 July 2009; Accepted 29 March 2010

Academic Editor: Ward Beyermann

Copyright © 2010 S. A. Mahmoud et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Nanostructure and electrical properties of iridium oxide ( I r O 2 ) thin films prepared by spray pyrolysis technique (SPT) have been experimentally characterized. The effect of solution molarity (SM) and substrate temperature ( 𝑇 s u b ) on the nanostructure features and electrical conductivity of these films has been investigated. The results of X-ray diffraction (XRD) showed that all samples prepared at 𝑇 s u b = 3 5 0 ∘ C with different SM, I r O 2 appear almost in amorphous form. XRD revealed that the films deposited at 𝑇 s u b = 4 5 0 ∘ C were tetragonal structures with a preferential orientation along ⟨ 1 0 1 ⟩ direction. Moreover, the degree of crystallinity was improved by solution molarity. Single order Voigt profile method has been used to determine the nanostructure parameters at different SM and 𝑇 s u b . The dark conductivity measurements at room temperature as a function of SM were observed and the value of conductivity were slightly increases at higher SM, reaching the bulk value of 20 Ω − 1 c m − 1 . The values of activation energy of Δ 𝐸 and 𝜎 𝑜 of I r O 2 were found to be 0.21 eV and 1 . 6 8 × 1 0 − 3 Ω − 1 · c m − 1 , respectively.