Ellipsometric Characterization of Thin Films from Multicomponent Chalcogenide Glasses for Application in Modern Optical Devices

Figure 5

Variation of the refractive index depending on the order of deposition of discrete films (𝑖=1−8) from bulk As₃₈S₅₆Tl₆ glass. The effective value of the refractive index of the coating is given as 𝑛_eff (dotted line). The exponential extrapolation of the variation of 𝑛 of sublayers is given by dashed line. The dashed-dotted line represents the same dependence for thin As₄₀S₆₀ layers.