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Advances in Condensed Matter Physics
Volume 2013 (2013), Article ID 435938, 5 pages
Research Article

Effect of Annealing Temperature on the Morphology and Piezoresponse Characterisation of Poly(vinylidene fluoride-trifluoroethylene) Films via Scanning Probe Microscopy

1Research School of Chemistry, The Australian National University, Canberra, ACT 0200, Australia
2Centre for Advanced Microscopy, The Australian National University, Canberra, ACT 0200, Australia

Received 6 June 2013; Accepted 30 September 2013

Academic Editor: Jianhua Hao

Copyright © 2013 K. Lau et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


Poly(vinylidene fluoride-trifluoroethylene) (PVDF-TrFE (70/30)) films were synthesized on a gold/glass substrate via spin coating. The films were annealed at a temperature between and . Nanoscale characterisation of the morphology, polarization switching, and local piezoresponse hysteresis loops of PVDF-TrFE film was studied using a scanning probe microscope (SPM). Ferroelectric switchable domains were identified by piezoresponse force microscopy (PFM) for all films. Small grains, with weak piezoresponse character, were observed for films annealed just above the Curie temperature. Acicular grains were obtained when the annealing temperature approached the melting point and the piezoresponse increased. Annealing above the melting point decreased the piezoresponse and the morphology changed dramatically into plate-like structures.