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Advances in Condensed Matter Physics
Volume 2013, Article ID 673948, 6 pages
Research Article

The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors

State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

Received 28 October 2013; Accepted 7 November 2013

Academic Editor: Danyang Wang

Copyright © 2013 Jie Xiong et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.


1  m-thick (YBCO) films were grown on the Y2O3/yttria stabilized zirconia (YSZ)/CeO2 buffer layers with different surface morphologies using direct-current sputtering. The critical current density ( ) value of YBCO was 1.1 MA/cm2 when the root mean square surface roughness ( ) of the buffer layer was 2.5 nm. As the of the buffer layer increased to 15 nm, the decreased to 0.3 MA/cm2. X-ray diffraction and scanning electron microscopy showed the strong relevance of the evolution of the structure and surface morphologies of YBCO films with the buffer layer of different . A model was proposed to explain the influence of surface morphology on the superconducting properties of YBCO films.