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Advances in Condensed Matter Physics
Volume 2013 (2013), Article ID 673948, 6 pages
http://dx.doi.org/10.1155/2013/673948
Research Article

The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors

State Key Laboratory of Electronic Thin Film and Integrated Devices, University of Electronic Science and Technology of China, Chengdu 610054, China

Received 28 October 2013; Accepted 7 November 2013

Academic Editor: Danyang Wang

Copyright © 2013 Jie Xiong et al. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Jie Xiong, Yudong Xia, Fei Zhang, et al., “The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors,” Advances in Condensed Matter Physics, vol. 2013, Article ID 673948, 6 pages, 2013. doi:10.1155/2013/673948