The Influence of Surface Morphology of Buffer Layer on the Critical Current Density in YBCO Coated Conductors

Table 1

The 𝑅_rms of the buffer layers and the values of out-of-plane and in-plane textures of the corresponding YBCO films.

Sample	a	b	c	d	e
𝑅rms of CeO2	2.5 nm	4.6 nm	5.8 nm	9.5 nm	15.2 nm
Δ𝜔 of (002) YBCO	2.37°	2.98°	2.92°	2.97°	3.2°
Δ𝜙 of (103) YBCO	4.91°	4.77°	5.07°	4.72°	5.48°