Research Article

A Circuit Model for CMOS Hall Cells Performance Evaluation including Temperature Effects

Table 1

Specific parameters evaluation for some of the integrated Hall cells.

Integrated geometryXLOptimumBorderless

Shape968647.table.001a968647.table.001b968647.table.001c
Measured (kΩ)
@  K,  T
2.21.81.3
Measured (V/AT)
@ = 1 mA
80.662.431.1
Measured offset drift ( T/°C) 0.039 0.3280.526
L,W (μm) of the n-well
Contacts length (μm) 18.34.72.3