Structural and Optical Properties of Amorphous Al<sub>2</sub>O<sub>3</sub> Thin Film Deposited by Atomic Layer Deposition

<div class="floats-full-page floats-full-page-figure"><h2>Figure 5</h2><div class="floats-full-page-caption"><div>Al<sub>2</sub>O<sub>3</sub> films ellipsometry spectra of fit data (continued curves) and measured data (gauge points).</div></div><div class="floats-full-page-content"><table class="figure-group"><tr class="fig-image"><td><object data="https://static-01.hindawi.com/articles/acmp/volume-2018/7598978/figures/7598978.fig.005.svgz" name="7598978.fig.005" type="image/svg+xml"></object></td></tr></table></div></div>

Figure 5 | Structural and Optical Properties of Amorphous Al<sub>2</sub>O<sub>3</sub> Thin Film Deposited by Atomic Layer Deposition

title

Figure 5: Structural and Optical Properties of Amorphous Al<sub>2</sub>O<sub>3</sub> Thin Film Deposited by Atomic Layer Deposition

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Figure 5 | Structural and Optical Properties of Amorphous Al2O3 Thin Film Deposited by Atomic Layer Deposition

Figure 5

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<p><em>Advances in Condensed Matter Physics</em> publishes research on the experimental and theoretical study of the physics of materials in solid, liquid, amorphous, and exotic states.</p>


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<p>Chief Editor, Professor Ulloa, is based at Ohio University and is a condensed matter theorist. His research is focussed on the electronic properties of nanostructures including quantum dots and nanowires, as well as proximity effects in 2D crystals.</p>


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