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Analytical Cellular Pathology
Volume 23, Issue 3-4, Pages 159-165
http://dx.doi.org/10.1155/2001/367976

Automatic Registration and Error Detection of Multiple Slices Using Landmarks

Hans Frimmel,1 Lars Egevad,2 Christer Busch,3 and Ewert Bengtsson1

1Centre for Image Analysis, Uppsala, Sweden
2Department of Pathology, Karolinska Hospital, Stockholm, Sweden
3Department of Pathology, University Hospital, Tromsö, Norway

Copyright © 2001 Hindawi Publishing Corporation. This is an open access article distributed under the Creative Commons Attribution License, which permits unrestricted use, distribution, and reproduction in any medium, provided the original work is properly cited.

How to Cite this Article

Hans Frimmel, Lars Egevad, Christer Busch, and Ewert Bengtsson, “Automatic Registration and Error Detection of Multiple Slices Using Landmarks,” Analytical Cellular Pathology, vol. 23, no. 3-4, pp. 159-165, 2001. https://doi.org/10.1155/2001/367976.