Surface and Buildup Region Dose Measurements with Markus Parallel-Plate Ionization Chamber, GafChromic EBT3 Film, and MOSFET Detector for High-Energy Photon Beams

<div>Percentage depth doses (PDDs) for 6 MV (a) and 15 MV (b) measured with Markus chamber, EBT3 film, and MOSFET detector, respectively, at the phantom surface for normal and oblique incident beams.</div>

Advances in High Energy Physics

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Figure 6

Figure 6: Surface and Buildup Region Dose Measurements with Markus Parallel-Plate Ionization Chamber, GafChromic EBT3 Film, and MOSFET Detector for High-Energy Photon Beams 

Figure 6 | Surface and Buildup Region Dose Measurements with Markus Parallel-Plate Ionization Chamber, GafChromic EBT3 Film, and MOSFET Detector for High-Energy Photon Beams 