Research Article
Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups
Figure 1
Schematic of the one-port open coaxial used for dielectric measurement, showing the material under test (MUT) with its dielectric properties: (a) 3D schematic view; (b) longitudinal cut (revolution symmetry with respect to z).
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(b) |