Advances in Mathematical Physics / 2019 / Article / Fig 1

Research Article

Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups

Figure 1

Schematic of the one-port open coaxial used for dielectric measurement, showing the material under test (MUT) with its dielectric properties: (a) 3D schematic view; (b) longitudinal cut (revolution symmetry with respect to z).
(a)
(b)