Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups

<div>Schematic of the two-port coaxial holder for dielectric measurement, showing the material under test (MUT): (a) 3D schematic view; (b) longitudinal cut (revolution symmetry with respect to z).</div>

Advances in Mathematical Physics

fig2

Figure 2

Figure 2: Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups 

Figure 2 | Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups 