Advances in Mathematical Physics / 2019 / Article / Fig 2

Research Article

Higher-Order Mode Electromagnetic Analysis of a Material Sample between Two Flanged Coaxial Probes for Broadband Modelling of Dielectric Measurement Setups

Figure 2

Schematic of the two-port coaxial holder for dielectric measurement, showing the material under test (MUT): (a) 3D schematic view; (b) longitudinal cut (revolution symmetry with respect to z).
(a)
(b)