Advances in Evaporated Solid-Phase-Crystallized Poly-Si Thin-Film Solar Cells on Glass (EVA)
Figure 4
(a) Dark lock-in
thermography (DLIT) image of one test structure with self-aligned emitter
groove metallization after the baking procedure. The image was taken at a
lock-in frequency of
20 Hz, using a forward bias voltage of 250 mV. (b) is the same as (a), but for
a reverse bias voltage of 250 mV. (c)
Topography image of the same sample region for comparison.
