Research Article
Microcavity Silicon Photodetectors at 1.55 μm
Table 3
Optical and electrical properties for silicon and copper used in our simulations.
| | Complex refractive index at 1550 nm | Thickness [μm] | Mean free path (Le) [μm] | Fermi level (EF) [eV] | Potential barrier () [eV] |
| Copper (Cu) | 0.145-j9.830 | 0.20 | 0.045 | 7.050 | 0.720 | Silicon | 3.48 | 100 | — | — | — |
|
|