Advances in OptoElectronics / 2013 / Article / Fig 2

Research Article

Burn-In Aging Behavior and Analytical Modeling of Wavelength-Division Multiplexing Semiconductor Lasers: Is the Swift Burn-In Feasible for Long-Term Reliability Assurance?

Figure 2

The sublinear fitting curve as a function of fitting exponent ( ). The saturation is more pronounced when is smaller.
568945.fig.002

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